Summary
design of radiation “hard” sensors
- possible by following certain rules and by introducing individual impurities
radiation tolerant (hard) processes
- present deep submicron technologies are rad. tolerant provided special layout rules are obeyed
- must maintain significant effort in the assessment of radiation problems in new technologies
- scaling of CMOS opens new challenges for vertex detectors
- a reasonable infrastructure and level of competence must be maintained within HEP if we want to remain at the cutting edge of development