Single Event Effects
track of an ionising particle through a reverse bias pn-junction
along the track the field is verzerrt
collection of charge due to drift, funneling and diffusion
resulting a short current puls
- Serious concern for space electronics (solar flares)
- Radiation induced errors in microelectronic circuits
- caused when charged particles lose energy by ionising the medium through which they pass
- leaving behind a wake of electron-hole pairs
- bias across the oxide => transient current across the oxide
- With forthcoming LHC --> important issue for high energy physics community