Bulk Damages (NIEL)
 
 
- bulk damages maybe caused by neutral and charged particles
- ihigh energy particle interacts with an atom in the silicon lattice, enough energy maybe transfered to dislodge the atom from its position (Si: 25eV)
- primary knock on atom (PKA) looses its energy due to energy or displacement of further atoms until it stops --> cascade
- different local point defects
- high energy --> complexes
- defects induce several energy levels in the bandgap of the semiconductor