Classification of Radiation Effects
Surface Defects: Total Ionising Dose (TID)
- mainly affect electronic circuits
Bulk Damages: Non Ionising Energy Loss (NIEL)
- mainly affect sensor like structure (pn junctions)
Single event effects (SEE)
Transient Radiation Effects in Electronics (TREE) associated with detonation of nuclear weapons
“Radiation sensitive” materials:
- semi-conductors
- oxides
- heavy elements from interconnections (W, Ta, Au, Pb, Pt,....)