Table of Contents
PPT Slide
Introduction
Comparison with Space Environment
Classification of Radiation Effects
PPT Slide
TID: Ionisation in Si or SiO2
TID: Cumulated Ion. in a MOS Oxide
TID: Surface Damages
TID: NMOS-Transistor
TID: Threshold Voltage Shifts
TID: Increase of Leakage Current
TID: Dose Rate Effect, Example:NMOS
TID: Dose Rate Effect, Example:NMOS
PPT Slide
Bulk Damages (NIEL)
NIEL :Typical Defects in Silicon Lattice
NIEL: Bulk Damages
NIEL: Bulk Damages
NIEL: Bulk Damages
NIEL: Bulk Damages
Non Ionising Energy Loss (NIEL)
Damage Function D(E) with an Example
PPT Slide
Single Event Effects
Mitigation Techniques
PPT Slide
Design of Radiation “Hard” Sensor
Radiation Damages in Sensor
ATLAS Sensor Concept
ATLAS Sensor Concept
Isolation techniques
Crystal Alteration
Result: Sensor concept
PPT Slide
The Solution: Deep Submicron
Principles of rad-tol design
Principles of rad-tol design
Guard Rings
SEE effects in Deep Submicron
Current status of rad tol design
Summary
Summary
References
Summary of rad. induced degradation effects
|
Author: x
Email: ingrid.gregor@desy.de
Home Page: http://www-zeuthen.desy.de/
Download presentation source
|